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Replace Unit Test Device State with Fixed PCD
Description DeviceStateLib provides an interface to get and set various device state indicators (secure boot, unit test mode, etc.). This change removes the unit test mode setting from the DeviceStateLib interface and transitions it to a fixed at build PCD so it cannot be changed at runtime. The one instance in this repo where DEVICE_STATE_UNIT_TEST_MODE was referenced has been updated to reference the PCD. - [x] Impacts functionality? - **Functionality** - Does the change ultimately impact how firmware functions? - Examples: Add a new library, publish a new PPI, update an algorithm, ... - [x] Impacts security? - **Security** - Does the change have a direct security impact on an application, flow, or firmware? - Examples: Crypto algorithm change, buffer overflow fix, parameter validation improvement, ... - [x] Breaking change? - **Breaking change** - Will anyone consuming this change experience a break in build or boot behavior? - Examples: Add a new library class, move a module to a different repo, call a function in a new library class in a pre-existing module, ... - [ ] Includes tests? - **Tests** - Does the change include any explicit test code? - Examples: Unit tests, integration tests, robot tests, ... - [ ] Includes documentation? - **Documentation** - Does the change contain explicit documentation additions outside direct code modifications (and comments)? - Examples: Update readme file, add feature readme file, link to documentation on an a separate Web page, ... How This Was Tested Tested on Q35 Integration Instructions References to DEVICE_STATE_UNIT_TEST_MODE will need to be removed from platform code and platforms which want to set unit test mode will need to set the PCD in their platform DSC file(s).
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