Fix an inappropriate test expression to remove a logical short circuit #2368
Add this suggestion to a batch that can be applied as a single commit.
This suggestion is invalid because no changes were made to the code.
Suggestions cannot be applied while the pull request is closed.
Suggestions cannot be applied while viewing a subset of changes.
Only one suggestion per line can be applied in a batch.
Add this suggestion to a batch that can be applied as a single commit.
Applying suggestions on deleted lines is not supported.
You must change the existing code in this line in order to create a valid suggestion.
Outdated suggestions cannot be applied.
This suggestion has been applied or marked resolved.
Suggestions cannot be applied from pending reviews.
Suggestions cannot be applied on multi-line comments.
Suggestions cannot be applied while the pull request is queued to merge.
Suggestion cannot be applied right now. Please check back later.
In file: bigip_provision.py, there are four comparisons of Collection length that each creates a logical short circuit. I suggested that the Collection length comparison should be done without creating a logical short circuit.
Sponsorship and Support:
This work is done by the security researchers from OpenRefactory and is supported by the Open Source Security Foundation (OpenSSF): Project Alpha-Omega. Alpha-Omega is a project partnering with open source software project maintainers to systematically find new, as-yet-undiscovered vulnerabilities in open source code - and get them fixed – to improve global software supply chain security.
The bug is found by running the Intelligent Code Repair (iCR) tool by OpenRefactory and then manually triaging the results.